Title of Invention | " A METHOD OF DETERMINING A RESISTIVITY OF AN ANISOTROPIC EARTH FORMATION" |
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Abstract | A method is disclosed for real-time (well-site) resistivity anisotropy determination using array lateral logs or any other unfocused, lateral-type measurements, and array induction logs or any other focused, induction-type measurements. Near-vertical wells with a deviation angle of less than 30 degrees are considered. Since with a lateral log, at each logging depth the injected current has both horizontal and vertical components, the data contains information related to both horizontal (Rh) and vertical (Rv) resistivities. With array induction tool, the induced current in near-vertical wells has only a horizontal component, and the induction data contain information related to Rh only. Having those two data sets acquired in the same well, i... |
Full Text | DESCRIPTION (COMPLETE) OCR NOT PREPARE DUE TO PRINT PROBLEM WE CLAIM: 1. A method of determining a resistivity of an anisotropic earth formation, the method comprising: (a) obtaining a plurality of differential array resistivity measurement (511); (b) obtaining a plurality of induction resistivity measurements (511); and (c) processing (513, 515, 517) said plurality of unfocused differential array resistivity measurements and said plurality of induction resistivity measurements and obtaining therefrom the resistivity, said processing excluding an inversion of said induction log; the method characterized by: (d) the differential array resistivity measurements comprise unfocused measurements (lateral log). 2. The method as claimed in claim 1, wherein the resistivity comprises a mean resistivity of the earth formation. 3. The method as claimed in claim 1, wherein the resistivity comprises a vertical resistivity of the earth formation. 4. The method as claimed in claim 1, wherein the resistivity comprises a horizontal resistivity of said earth formation. 5. The method as claimed in claim 1, wherein the plurality of induction measurements comprises focused measurements. 6. The method as claimed in claim 1, wherein the processing further comprises applying a borehole correction and an invasion correction to the lateral log. 7. The method as claimed in claim 1, wherein the processing further comprises applying a borehole correction and an invasion correction to the induction log and obtaining a horizontal resistivity. 8. The method as claimed in claim 7, wherein determining an anisotropy factor from a vertical resistivity and the horizontal resistivity. 9. The method as claimed in claim 1, wherein making measurements with a micro-laterolog and using said micro-laterolog measurements in said processing. 10. The method as claimed in claim 1, wherein step (a), (b) and (c) are performed using: (a) an unfocused differential array resistivity measuring device configured to obtain the plurality of unfocused differential array resistivity measurements (lateral log); (b) an induction resistivity measuring device configured to obtain the plurality of induction resistivity measurements; (c) a processor configured to process the plurality of unfocused differential array resistivity measurements and the plurality of induction resistivity measurements and estimates therefrom the parameter of interest, the processing excluding an inversion of the induction log. 11. The method as claimed in claim 10, wherein the processor is configured to estimate, the parameter of interest, a vertical resistivity of said earth formation. 12. The method as claimed in claim 10, wherein the processor is configured to estimate, as the parameter of interest, a horizontal resistivity of said earth formation. 13. The method as claimed in claim 10, wherein the induction resistivity measuring device is configured to obtain, as the plurality of induction measurements, focused measurements. 14. The method as claimed in claim 10, wherein the processor is configured to apply a borehole correction and an invasion correction to the lateral log. 15. The method as claimed in claim 14, wherein the processor is configured to apply a borehole correction and an invasion correction to said induction log and obtain a horizontal resistivity. 16. The method as claimed in claim 15, wherein the processor is configured to determine the anisotropy factor from the vertical resistivity and the horizontal resistivity. 17. The method as claimed in claim 10, wherein the processor is configured to use the micro-laterolog in the processing. 18. The method as claimed in claim 10, wherein a processor is configured to perform said processing in real time 19. The method as claimed in claim 10, wherein a processor is at a surface location. 20 The method as claimed in claim 10, wherein the processor is at a downhole location. 21. The method as claimed in claim 10, wherein an induction resistivity device is an array device. 22. The method as claimed in claim 10, wherein an induction resistivity device having a plurality of coils with an axis parallel to an axis of said induction resistivity device. 23. The method as claimed in claim 10, wherein: (i) as the unfocused differential array resistivity device, an unfocused differential array resistivity measuring device configured to be conveyed into the borehole using a conveyance device, and (ii) as the induction resistivity device, an induction resistivity device configured to be conveyed into the borehole using the conveya. |
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1183-delnp-2005-complete specification (granted).pdf
1183-DELNP-2005-Correspondence-Others-(24-09-2009).pdf
1183-delnp-2005-correspondence-others.pdf
1183-delnp-2005-correspondence-po.pdf
1183-delnp-2005-description (complete).pdf
1183-DELNP-2005-Form-3-(24-09-2009).pdf
1183-delnp-2005-petition-137.pdf
1183-delnp-2005-petition-138.pdf
Patent Number | 241542 | |||||||||
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Indian Patent Application Number | 1183/DELNP/2005 | |||||||||
PG Journal Number | 29/2010 | |||||||||
Publication Date | 16-Jul-2010 | |||||||||
Grant Date | 12-Jul-2010 | |||||||||
Date of Filing | 24-Mar-2005 | |||||||||
Name of Patentee | BAKER HUGHES INCORPORATED | |||||||||
Applicant Address | 3900 ESSEX LANE, SUITE 1200, HOUSTON,TX 77027, UNITED STATES OF AMERICA | |||||||||
Inventors:
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PCT International Classification Number | G01V 3/20 | |||||||||
PCT International Application Number | PCT/US2003/030440 | |||||||||
PCT International Filing date | 2003-09-26 | |||||||||
PCT Conventions:
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